AP54RHC164 Radiation-Hardened SIPO Shift Registers

Apogee Semiconductor AP54RHC164 Radiation-Hardened 8-bit Serial-In Parallel-Out (SIPO) Shift Registers are members of the AP54RHC logic family. These shift registers operate within the 1.65V_DC to 5.5V_DC supply voltage range. The AP54RHC164 shift registers deliver high resiliency to Single-Event Effects (SEE) and up to Total Ionizing Dose (TID) resilience of 30krad (Si). These registers feature proprietary cold-sparing capability with zero static power penalty. The AP54RHC164 registers also feature a triple-redundant design, which allows the devices to be immune to Single-Event Transients (SET). The AP54RHC164ALT-R shift registers are flight-A grade, and the AP54RHC164ELT-R registers are evaluation grade. These registers are used in medical imaging, small satellites, and Leo constellations.